The Methods & Tools newsletter has released in its html archive section the article “Mocking the Embedded World: Test-Driven Development, Continuous Integration, and Design Patterns”. Despite a prevalent industry perception to the contrary, the agile practices of Test-Driven Development and Continuous Integration can be successfully applied to embedded software. We present here a holistic set of practices, platform independent tools, and a new design pattern (Model Conductor Hardware – MCH) that together produce: good design from tests programmed first, logic decoupled from hardware, and systems testable under automation. Ultimately, this approach yields an order of magnitude or more reduction in software flaws, predictable progress, and measurable velocity for data-driven project management. We use the approach discussed herein for real-world production systems and have included a full C-based sample project to illustrate it and links to the open source testing tools used to implement the practice.